The IEEE Instrumentation and Measurement Society is dedicated to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena.
The fields of interest include metrology, analogue and digital electronic instruments, systems and standards for measuring and recording electrical quantities (in both frequency and time domains), instrumentation and transducers for measurement of non-electrical variables, calibration and uncertainty, instruments with automated control and analysis functions, safety instrumentation, and new technology applications.
The IEEE Instrumentation and Measurement Society is also an active membership, sharing the same profession and interest, learning first hand of developing technologies, and uncovering opportunities for personal professional development.
The IEEE Instrumentation and Measurement Society Colombian Chapter and IEEE Colombia Section have chosen Cali as the venue for the First IEEE Colombian Conference on Instrumentation and Measurement. This event seeks to be the most important conference in Instrumentation and Measurement in Colombia putting together academic, scientific and industry.
We hope that local academy and industry will take active participation 2018. Papers will be reviewed by an international technical committee under the IEEE standard procedure and accepted papers must be presented in oral session. The conference proceedings will be submitted to the IEEE Xplore® digital library.
The event includes research, development and applications in the field of instrumentation and measurement science. It covers all aspects of the theory, practice and application of measurement, instrumentation and sensing across science and engineering. Of particular interest to the conference is the industrial applications, in which research becomes an enabler of the industry.
Authors are invited to submit their papers. The papers can be written in Spanish or English. Topics of interest are included, but are not limited to
• Measurement Systems and Theory
• Instrumentation and Measurement Developments
• Data Acquisition Systems
• Real-Time Measurements
• Internet of Things
• Image Processing
• Computational Intelligence Techniques
• Industrial Applications
• Measurement Applications
• Measurement of Electric and Magnetic Quantities
• Medical, Biomedical, and Healthcare Systems
• Non-invasive Measurement Techniques
• Robotics, Control, Mechanical, and Material Measurements
• Sensors, Actuators, and Transducers
• Signal Processing Techniques
• Techniques related to Instrumentation
• Virtual Measurement Systems
Full Paper Submission Deadline:
Abril 8th, May 20th
Notification of Acceptance Data:
June 10th, June 30th
Final Paper Submission Deadline:
July 8th, July 30th
Cel: 300 360 50 36
The articles must be submitted in digital format (PDF) through the paper submission page. Papers could be written in English or Spanish, titles and abstracts must be only in English. Papers must use the IEEE conference format. The maximum length is six (6) pages per article including illustrations and references. Each paper should indicate appropriateness for the scope of the Conference, originality and quality of the technical content, whole organization and writing style. All accepted papers presented at the conference will be submitted for publication to IEEE Xplore. Authors of accepted papers must register for the Conference and attend to present their papers.
Any doubt, please send an e-mail to: firstname.lastname@example.org
The IEEE reserves the right to exclude a paper from distribution after the conference (e.g., removal from IEEE Xplore® digital library) if the paper is not presented at the conference. Papers are reviewed on the basis that they do not contain plagiarized material and have not been submitted to any other conference at the same time (double submission). These matters are taken very seriously and The IEEE Instrumentation and Measurement Society Colombian Chapter will take action against any author who has engaged in either practice.
• IEEE Web Page on Plagiarism:
• IEEE Web Page on Double Submission:
• Benefits of Publishing with IEEE